On metrics and models for multiplex networks

Leiden Repository

On metrics and models for multiplex networks

Type: Doctoral Thesis
Title: On metrics and models for multiplex networks
Author: Gemmetto, V.
Issue Date: 2018-01-16
Keywords: Complex systems
Complex networks
Multiplex networks
Graph theory
International trade
Scientific publications network
Abstract: In this thesis, we extend the concept of null models as canonical ensembles of multi-graphs with given constraints and present new metrics able to characterize real-world layered systems based on their correlation patterns. We make extensive use of the maximum-entropy method in order to find the analytical expression of the expectation values of several topological quantities; furthermore, we employ the maximum-likelihood method to fit the models to real datasets. One of the main contributions of the present work is providing models and metrics that can be directly applied to real data. We introduce improved measures of overlap between layers of a multiplex and exploit such quantities to provide a new network reconstruction method applicable to multi-layer graphs. It turns out that this methodology, applicable to a specific class of multi-layer networks, can be successfully employed to reconstruct the World Trade Multiplex. Furthermore, we illustrate that the maximum-entropy models also allow us to find the so-called backbone of a real network, i.e. the information which is irreducible to the single-node properties and is therefore peculiar to the network itself. We conclude the thesis moving our attention to a different dataset, namely the scientific publication system.
Promotor: Supervisor: Saarloos W. van Co-Supervisor: Garlaschelli D.
Faculty: Science
University: Leiden
Uri: urn:isbn:9789085933298
Handle: http://hdl.handle.net/1887/61132

Files in this item

Description Size View
application/pdf Full Text 11.55Mb View/Open
application/pdf Cover 16.98Mb View/Open
application/pdf Title Page_Contents 240.0Kb View/Open
application/pdf Chapter 01 2.687Mb View/Open Full text at publisher site
application/pdf Chapter 02 5.102Mb View/Open Full text at publisher site
application/pdf Chapter 03 620.2Kb View/Open
application/pdf Chapter 04 3.565Mb View/Open
application/pdf Chapter 05 1.067Mb View/Open Full text at publisher site
application/pdf Concluding remarks 132.0Kb View/Open
application/pdf Summary_in Dutch 168.3Kb View/Open
application/pdf Publications_CV_Acknowledgements 196.6Kb View/Open
application/pdf Propositions 120.3Kb View/Open

This item appears in the following Collection(s)