Development of Metrology using Fringe Reflection Technique for Silicon Pore Optics for ESA ATHENA X-ray Space Observatory

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Development of Metrology using Fringe Reflection Technique for Silicon Pore Optics for ESA ATHENA X-ray Space Observatory

Type: Master thesis
Title: Development of Metrology using Fringe Reflection Technique for Silicon Pore Optics for ESA ATHENA X-ray Space Observatory
Author: Prancikevicius, Arnas
Issue Date: 2015-08-25
Keywords: Phase Deflectometry
Fringe Reflection Technique
Free-form specular surface metrology
X-ray astronomy
Abstract: Results of a six-month-long internship in cosine Science & Computing BV are presented. Data of a full-field Fringe Reflection Technique measurements of Silicone Pore Optics components for ATHENA X-ray observatory were used for least-square fitting and evaluation of surface quality. Basic forward ray tracing was used to evaluate the components’ performance in X-rays: half-energy width and point-spread function were calculated. The best-fitting surface parameters and optical performance were compared with manufacturer’s specifications and X-ray measurements performed in Berlin Electron Storage Ring Society for Synchrotron Radiation (BESSY). Even though the FRT measurements exhibited nanometer height accuracy of local surface features, constant discrepancies of the measured figure parameters were noticed. However, a correspondence between axial slope deviations measured with FRT and X-rays was found for a silicon plate of SPO stack.
Supervisor: Exter, Martin van
Faculty: Faculty of Science
Department: Physics (Master)
Specialisation: Research in Experimental Physics
ECTS Credits: 8
Handle: http://hdl.handle.net/1887/37097
 

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