Electromigration in Bismuth

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Electromigration in Bismuth

Type: Master thesis
Title: Electromigration in Bismuth
Author: Ruytenberg, Thomas
Issue Date: 2015-08-31
Keywords: bismuth
electromigration
topological insulator
Abstract: Electromigration in bismuth is studied as a way to create bismuth(111) bilayers. Temperature-dependent electromigration measurements have been performed and a model incorporating Joule heating is used to describe those. An activation energy for diffusion between 100 and 180meV is found. Furthermore, in-situ electromigration experiments have been performed in a scanning electron microscope. This allowed us to link events in the conductance traces of bismuth constrictions during electromigration to visual features. Specifically, remerging of the bismuth electrodes was found to cause increases in conduction.
Supervisor: Jobst, JohannesMolen, Sense Jan van der
Faculty: Faculty of Science
Department: Physics (Master)
Specialisation: Experimental Physics
ECTS Credits: 5
Handle: http://hdl.handle.net/1887/37084
 

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