Low-energy electron microscopy on two-dimensional systems: : growth, potentiometry and band structure mapping

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Low-energy electron microscopy on two-dimensional systems: : growth, potentiometry and band structure mapping

Type: Doctoral Thesis
Title: Low-energy electron microscopy on two-dimensional systems: : growth, potentiometry and band structure mapping
Author: Kautz, Jaap
Publisher: Leiden Institute of Physics (LION), Faculty of Science, Leiden Univesity
Issue Date: 2015-04-30
Keywords: LEEM
Si(111)
Au
Potentiometry
LEEP
Band Structure
Abstract: Low Energy Electron Microscopy (LEEM) is a microscopy technique typically used to study surface processes. The sample is illuminated with a parallel beam of electrons under normal incidence and the reflected electrons are projected onto a pixelated detector, where an image is formed. In the first part of this thesis, we use LEEM to study the behavior of submonolayers of gold on Si(111). After a thorough analysis of the Si-Au system, we describe the behavior of these (sub)monolayers when exposed to alkanethiols. In the second part of this thesis we move away from pure surface physics and introduce two new applications for LEEM. The first of these, Low-Energy Electron Potentiometry (LEEP), can be used to visualize electrical conductance. We show that for layered two-dimensional materials we can obtain a higher resolution in LEEP experiments. Finally, in chapter 6, we present a new method to measure the dispersion relation of unoccupied states in two-dimensional layered materials.
Description: Promotores: J.M. van Ruitenbeek, R.M. Tromp, Co-Promotor: S.J. van der Molen
With summary in Dutch
Faculty: Faculteit der Wiskunde en Natuurwetenschappen
Citation: Kautz, J., 2015, Doctoral Thesis, Leiden University
Series/Report no.: Casimir PhD series, Delft-Leiden;2015-09
ISBN: 9789085932178
Handle: http://hdl.handle.net/1887/32852
 

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