Imaging with aberration-corrected low energy electron microscopy

Leiden Repository

Imaging with aberration-corrected low energy electron microscopy

Title: Imaging with aberration-corrected low energy electron microscopy
Author: Schramm, Sebastian Markus
Publisher: Department of Condensed Matter Physics, Leiden Institute of Physics (LION), Faculty of Science, Leiden University
Issue Date: 2013-04-25
Keywords: LEEM
Electron microscopy
Contrast transfer function
Abstract: In this thesis we discuss imaging with aberration-corrected Low Energy Electron Microscopy in theory as well as in the experiment.
Description: Promotor: R.M. Tromp Co-Promotor: S.J. van der Molen
With Summary in Dutch
Faculty: Faculteit der Wiskunde en Natuurwetenschappen
Citation: Schramm, S.M., 2013, Doctoral Thesis, Leiden University
Series/Report no.: Casimir PhD Series;2013-9
ISBN: 9789085931522

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