Persistent URL of this record https://hdl.handle.net/1887/18057
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Real-time scanning tunneling microscopy studies of thin film deposition and ion erosion
- All authors
- Fokkema, V.
- Supervisor
- Frenken, J.W.M.
- Co-supervisor
- Rost, M.J.
- Committee
- Bijkerk, F.; Eliel, E.R.; Michely, T.; Molen, S.J. van der; Palasantzas, G.; Rijnders, A.J.H.M.; Sanden, M.C.M van de; Zandvliet, H.J.W.
- Qualification
- Doctor (dr.)
- Awarding Institution
- Leiden Institute of Physics , Faculty of Science , Leiden University
- Date
- 2011-11-10
- ISBN
- 9789085931089
Juridical information
- Court
- LEI Universiteit Leiden