Persistent URL of this record https://hdl.handle.net/1887/61253
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- Scanning probe microscopes go video rate and beyond
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Scanning probe microscopes go video rate and beyond
- All authors
- Rost, M.J.; Crama, L.; Schakel, P.; Tol, E.H. van; Velzen-Williams, G.B.E.M.; Overgauw, C.F.; Horst, H. ter; Dekker, H.; Okhuijsen, B.; Seynen, M.; Vijftigschild, A.; Han, P.; Katan, A.J.; Schoots, K.; Schumm, R.; Loo, W.A.; Oosterkamp, T.H.; Frenken, J.W.M.
- Date
- 2005
- Journal
- Review of Scientific Instruments
- Volume
- 76
- Issue
- 18
- Pages
- 053710